×
验证码:
换一张
忘记密码?
记住我
×
登录
中文版
|
English
中国科学院半导体研究所机构知识库
Knowledge Management System Of Institute of Semiconductors,CAS
ALL
ORCID
题名
作者
学科领域
关键词
文献类型
出处
收录类别
出版者
发表日期
存缴日期
资助项目
学科门类
学习讨论厅
图片搜索
粘贴图片网址
首页
研究单元&专题
作者
文献类型
学科分类
知识图谱
新闻&公告
在结果中检索
研究单元&专题
中国科学院半导体研... [15]
作者
赵德刚 [1]
文献类型
会议论文 [15]
发表日期
2008 [1]
2006 [2]
2004 [2]
2003 [1]
2001 [2]
2000 [4]
更多...
语种
英语 [15]
出处
JOURNAL OF... [2]
THIN SOLID... [2]
Internatio... [1]
JOURNAL OF... [1]
JOURNAL OF... [1]
JOURNAL OF... [1]
更多...
资助项目
收录类别
CPCI-S [13]
其他 [2]
资助机构
China Natl... [2]
Chinese Va... [2]
IEEE Elect... [1]
Japan Soc ... [1]
Japan Soc ... [1]
Natl Steer... [1]
更多...
×
知识图谱
SEMI OpenIR
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共15条,第1-10条
帮助
限定条件
文献类型:会议论文
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
期刊影响因子升序
期刊影响因子降序
作者升序
作者降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
WOS被引频次升序
WOS被引频次降序
题名升序
题名降序
AlGaN layers grown on AlGaN buffer layer and GaN buffer layer using strain-relief interlayers - art. no. 68410S
会议论文
SOLID STATE LIGHTING AND SOLAR ENERGY TECHNOLOGIES, Beijing, PEOPLES R CHINA, NOV 12-14, 2007
作者:
Liu, NX
;
Yan, JC
;
Liu, Z
;
Ma, P
;
Wang, JX
;
Li, JM
;
Liu, NX, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China.
Adobe PDF(370Kb)
  |  
收藏
  |  
浏览/下载:2342/749
  |  
提交时间:2010/03/09
Algan
Ht-algan Buffer
Ht-interlayers
Ultraviolet (Uv) Led
Tuning of emission wavelength of InAs/GaAs quantum dots sandwiched by combination layers
会议论文
International Journal of Nanoscience丛书标题: International Journal of Nanoscience Series, Beijing, PEOPLES R CHINA, NOV 24-27, 2004
作者:
Fang, ZD (Fang, Zhidan)
;
Gong, M (Gong, Meng)
;
Miao, ZH (Miao, Zhenhua)
;
Niu, ZC (Niu, Zhichuan)
;
Fang, ZD, Chinese Acad Sci, Inst Semicond, Natl Lab Superlattices & Microstruct, Beijing 100083, Peoples R China.
Adobe PDF(431Kb)
  |  
收藏
  |  
浏览/下载:1677/334
  |  
提交时间:2010/03/29
Quantum Dots
Photoluminescence
Combination Layer
1.3 Mu-m
Lasers
Inalas
Heterojunction solar cells with n-type nanocrystalline silicon emitters on p-type c-Si wafers
会议论文
JOURNAL OF NON-CRYSTALLINE SOLIDS, Lisbon, PORTUGAL, SEP 04-09, 2005
作者:
Xu Y (Xu Ying)
;
Hu ZH (Hu Zhihua)
;
Diao HW (Diao Hongwei)
;
Cai Y (Cai Yi)
;
Zhang SB (Zhang Shibin)
;
Zeng XB (Zeng Xiangbo)
;
Hao HY (Hao Huiying)
;
Liao XB (Liao Xianbo)
;
Fortunato E (Fortunato Elvira)
;
Martins R (Martins Rodrigo)
;
Hu, ZH, New Univ Lisbon, Dept Mat Sci, Monte Caparica, P-2829516 Caparica, Almada, Portugal. 电子邮箱地址: zhu@uninova.pt
Adobe PDF(110Kb)
  |  
收藏
  |  
浏览/下载:2264/491
  |  
提交时间:2010/03/29
Silicon
Microstructural and compositional characteristics of GaN films grown on a ZnO-buffered Si(111) wafer
会议论文
MICRON, 35 (6), Wuhan, PEOPLES R CHINA, OCT 17-21, 2003
作者:
Luo XH
;
Wang RM
;
Zhang XP
;
Zhang HZ
;
Yu DP
;
Luo MC
;
Wang RM Peking Univ Electron Microscopy Lab Beijing 100871 Peoples R China. 电子邮箱地址: rmwang@pku.edu.cn
Adobe PDF(419Kb)
  |  
收藏
  |  
浏览/下载:1459/365
  |  
提交时间:2010/10/29
Transmission Electron Microscopy
Electron Energy Loss Spectroscopy
Molecular Beam Epitaxy
Gallium Nitride
Chemical-vapor-deposition
Epitaxy
Layer
Molecular beam epitaxial growth of GaN on 3c-SiC/Si(111) substrates using a thick AIN buffer layer
会议论文
SMIC-XIII 2004 13th International Conference on Semiconducting & Insulating Materials, Beijing, PEOPLES R CHINA, SEP 20-25, 2004
作者:
Gao, X
;
Li, JM
;
Sun, GS
;
Zhang, NH
;
Wang, L
;
Zhao, WS
;
Zeng, YP
;
Gao, X, Chinese Acad Sci, Inst Semicond, Novel Semicond Mat Lab, Beijing 100083, Peoples R China.
Adobe PDF(1172Kb)
  |  
收藏
  |  
浏览/下载:1193/196
  |  
提交时间:2010/03/29
Si(111)
Aln
Low-frequency noise properties of GaN Schottky barriers deposited on intermediate temperature buffer layers
会议论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 6 (5-6), Sendai, JAPAN, MAR 20-22, 2003
作者:
Leung BH
;
Fong WK
;
Surya C
;
Lu LW
;
Ge WK
;
Surya C Hong Kong Polytech Univ Photon Res Ctr Dept Elect & Informat Engn Hong Kong Hong Kong Peoples R China. 电子邮箱地址: ensurya@polyu.edu.hk
Adobe PDF(191Kb)
  |  
收藏
  |  
浏览/下载:1413/281
  |  
提交时间:2010/10/29
Gan
Low-frequency Noise
Deep Levels
Deep Level Transient Fourier Spectroscopy
Devices
Orientation relationship between hexagonal inclusions and cubic GaN grown on GaAs(001) substrates
会议论文
JOURNAL OF CRYSTAL GROWTH, 227, BEIJING, PEOPLES R CHINA, SEP 11-15, 2000
作者:
Qu B
;
Zheng XH
;
Wang YT
;
Xu DP
;
Lin SM
;
Yang H
;
Liang JW
;
Qu B Chinese Acad Sci Inst Semicond State Key Lab Integrated Optoelectron POB 912 Beijing 100083 Peoples R China.
Adobe PDF(191Kb)
  |  
收藏
  |  
浏览/下载:1674/385
  |  
提交时间:2010/11/15
X-ray Diffraction
Nitrides
Semiconducting Iii-v Materials
Phase
Films
High-quality metamorphic HEMT grown on GaAs substrates by MBE
会议论文
JOURNAL OF CRYSTAL GROWTH, 227, BEIJING, PEOPLES R CHINA, SEP 11-15, 2000
作者:
Zeng YP
;
Cao X
;
Cui LJ
;
Kong MY
;
Pan L
;
Wang BQ
;
Zhu ZP
;
Cao X Chinese Acad Sci Inst Semicond POB 912 Beijing 100083 Peoples R China.
Adobe PDF(148Kb)
  |  
收藏
  |  
浏览/下载:1311/394
  |  
提交时间:2010/11/15
Molecular Beam Epitaxy
High Electron Mobility Transistors
Density
In situ annealing during the growth of relaxed SiGe
会议论文
OPTICAL AND INFRARED THIN FILMS, 4094, SAN DIEGO, CA, 36739
作者:
Li DZ
;
Huang CJ
;
Cheng BW
;
Wang HJ
;
Yu Z
;
Zhang CH
;
Yu JZ
;
Wang QM
;
Li DZ Chinese Acad Sci Inst Semicond State Key Lab Integrated Optoelect Beijing 100083 Peoples R China.
Adobe PDF(1540Kb)
  |  
收藏
  |  
浏览/下载:1225/204
  |  
提交时间:2010/10/29
Ultrahigh Vacuum Chemical Vapor Deposition
Sige
Refractive High Energy Electron Diffraction
Tansmission Electron Microscopy
Double Crystal X-ray Diffraction
Mobility 2-dimensional Electron
Critical Thickness
Strained Layers
Ge
Relaxation
Epilayers
Si1-xgex
Gesi/si
Gases
Influences of initial buffer layer deposition on electrical and optical properties in cubic GaN grown on GaAs(100) by metalorganic chemical vapor deposition
会议论文
THIN SOLID FILMS, 368 (2), SHANGHAI, PEOPLES R CHINA, MAY 10-13, 1999
作者:
Xu DP
;
Yang H
;
Li JB
;
Li SF
;
Zhao DG
;
Wang YT
;
Sun XL
;
Wu RH
;
Xu DP Chinese Acad Sci Natl Res Ctr Optoelect Technol Inst Semicond Beijing 100864 Peoples R China.
Adobe PDF(194Kb)
  |  
收藏
  |  
浏览/下载:1193/252
  |  
提交时间:2010/11/15
Cubic Gan
Buffer Layer
Atomic Force Microscopy
Reflection High-energy Electron Diffraction
Movpe