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Space Program SJ-10 of Microgravity Research 期刊论文
MICROGRAVITY SCIENCE AND TECHNOLOGY, 2014, 卷号: 26, 期号: 3, 页码: 159-169
Authors:  Hu, WR;  Zhao, JF;  Long, M;  Zhang, XW;  Liu, QS;  Hou, MY;  Kang, Q;  Wang, YR;  Xu, SH;  Kong, WJ;  Zhang, H;  Wang, SF;  Sun, YQ;  Hang, HY;  Huang, YP;  Cai, WM;  Zhao, Y;  Dai, JW;  Zheng, HQ;  Duan, EK;  Wang, JF
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Growth of high quality semi-insulating InP single crystal by suppression of compensation defects 期刊论文
JOURNAL OF RARE EARTHS, 2006, 卷号: 24, 期号: Sp.Iss.SI, 页码: 75-77
Authors:  Zhao YW;  Dong ZY;  Duan ML;  Sun WR;  Yang ZX;  Zhao, YW, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China. E-mail: zhaoyw@red.semi.ac.cn
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Indium Phosphide  Defect  Semi-insualting  Stimulated Current Spectroscopy  Current Transient Spectroscopy  Semi-insulating Inp  Deep-level Defects  Fe  
Growth of high quality semi-insulating InP single crystal by suppression of compensation defects 会议论文
JOURNAL OF RARE EARTHS, Beijing, PEOPLES R CHINA, OCT 16-19, 2005
Authors:  Zhao, YW;  Dong, ZY;  Duan, ML;  Sun, WR;  Yang, ZX;  Zhao, YW, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China. 电子邮箱地址: zhaoyw@red.semi.ac.cn
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Indium Phosphide  
半绝缘InP中深能级缺陷对电学性质的影响和缺陷的控制 期刊论文
半导体学报, 2006, 卷号: 27, 期号: 3, 页码: 524-529
Authors:  赵有文;  董志远;  李成基;  段满龙;  孙文荣
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高质量InAs单晶材料的制备及其性质 期刊论文
半导体学报, 2006, 卷号: 27, 期号: 8, 页码: 1391-1395
Authors:  赵有文;  孙文荣;  段满龙;  董志远;  杨子祥;  吕旭如;  王应利
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磷化铟单晶衬底的缺陷控制和高质量表面制备 期刊论文
半导体学报, 2006, 卷号: 27, 期号: 12, 页码: 2127-2133
Authors:  赵有文;  董志远;  孙文荣;  段满龙;  杨子祥;  吕旭如
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Annealing ambient controlled deep defect formation in InP 会议论文
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 27 (1-3), Batz sur Mer, FRANCE, SEP 29-OCT 02, 2003
Authors:  Zhao YW;  Dong ZY;  Duan ML;  Sun WR;  Zeng YP;  Sun NF;  Sun TN;  Zhao YW Chinese Acad Sci Inst Semicond Ctr Mat Sci POB 912 Beijing 100083 Peoples R China. 电子邮箱地址: zhaoyw@red.semi.ac.nc
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Fe-doped Inp  Semiinsulating Inp  Point-defects  Pressure  Wafers  Traps  
Annealing ambient controlled deep defect formation in InP 期刊论文
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2004, 卷号: 27, 期号: 1-3, 页码: 167-169
Authors:  Zhao, YW;  Dong, ZY;  Duan, ML;  Sun, WR;  Zeng, YP;  Sun, NF;  Sun, TN;  Zhao, YW, Chinese Acad Sci, Inst Semicond, Ctr Mat Sci, POB 912, Beijing 100083, Peoples R China. 电子邮箱地址: zhaoyw@red.semi.ac.nc
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Fe-doped Inp  
Microdefects and electrical uniformity of InP annealed in phosphorus and iron phosphide ambiances 期刊论文
JOURNAL OF CRYSTAL GROWTH, 2003, 卷号: 259, 期号: 1-2, 页码: 1-7
Authors:  Dong ZY;  Zhao YW;  Zeng YP;  Duan ML;  Sun WR;  Jiao JH;  Lin LY;  Dong ZY,Chinese Acad Sci,Inst Semicond,Ctr Mat Sci,POB 912,Beijing 100083,Peoples R China.
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Annealing  Defects  Etching  Semiconducting Indium Phosphide  Fe-doped Inp  Semiinsulating Inp  Indium-phosphide  Defects  Diffusion  Crystals  Wafers  
提高(100)晶向磷化铟单晶的成晶率和质量的研究 期刊论文
人工晶体学报, 2003, 卷号: 32, 期号: 5, 页码: 460-463
Authors:  赵有文;  段满龙;  孙文荣;  杨子祥;  焦景华;  赵建群;  曹慧梅;  吕旭如
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