Research on the band-gap of InN grown on siticon substrates
Xiao, HL; Wang, XL; Wang, JX; Zhang, NH; Liu, HX; Zeng, YP; Li, JM; Xiao, HL, Chinese Acad Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China.
2006
会议名称32nd International Symposium on Compound Semiconductors
会议录名称Physica Status Solidi C - Current Topics in Solid State Physics丛书标题: PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS
页码Vol 3 no 3 3 (3): 594-597
会议日期SEP 18-22, 2005
会议地点Rust, GERMANY
出版地605 THIRD AVE, NEW YORK, NY 10158-0012 USA
出版者WILEY-VCH, INC
ISSN1610-1634
部门归属chinese acad sci, inst semicond, beijing 100083, peoples r china
摘要Photoluminescence (PL) and absorption experiments were carried out to examine the fundamental band-gap of InN films grown on silicon substrates. A strong PL peak at 0.78 eV was observed at room temperature, which is much lower than the commonly accepted value of 1.9 eV. The integrated PL intensity was found to depend linearly on the excitation laser intensity over a wide intensity range. These results strongly suggest that the observed PL is related to the emission of the fundamental inter-band transitions of InN rather than to deep defect or impurity levels. Due to the effect of band-filling with increasing free electron concentration, the absorption edge shifts to higher energy. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
关键词Molecular-beam Epitaxy Wurtzite Inn Nitride Absorption Alloys Films
学科领域半导体材料
收录类别CPCI-S
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/9936
专题中国科学院半导体研究所(2009年前)
通讯作者Xiao, HL, Chinese Acad Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China.
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Xiao, HL,Wang, XL,Wang, JX,et al. Research on the band-gap of InN grown on siticon substrates[C]. 605 THIRD AVE, NEW YORK, NY 10158-0012 USA:WILEY-VCH, INC,2006:Vol 3 no 3 3 (3): 594-597.
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