SEMI OpenIR  > 中科院半导体照明研发中心
一种测量LED内量子效率的方法
安平博; 赵丽霞; 魏学成; 路红喜; 王军喜; 李晋闽
Rights Holder中国科学院半导体所
Date Available2016-09-12
Country中国
Subtype发明
Subject Area半导体器件
Application Date2014-03-05
Application NumberCN201410079018.5
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27362
Collection中科院半导体照明研发中心
Recommended Citation
GB/T 7714
安平博,赵丽霞,魏学成,等. 一种测量LED内量子效率的方法.
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