SEMI OpenIR  > 中科院半导体照明研发中心
用于测试器件光电性能的夹具及夹具组件
裴艳荣; 杨华; 赵丽霞; 王军喜; 李晋闽
Rights Holder中国科学院半导体研究所
Date Available2014
Country中国
Subtype发明
Subject Area半导体器件
Application Date2013-09-22
Application NumberCN201310432147.3
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25527
Collection中科院半导体照明研发中心
Recommended Citation
GB/T 7714
裴艳荣,杨华,赵丽霞,等. 用于测试器件光电性能的夹具及夹具组件.
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