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In-situ SEM investigation of sub-microscale deformation fields around a crack-tip in silicon 期刊论文
Optics and Lasers in Engineering, 2012, 卷号: 50, 期号: 12, 页码: 1694-1698
Authors:  Li, J.J;  Zhao, C.W;  Xing, Y.M;  Hou, X.H;  Fan, Z.C;  Jin, Y.J;  Wang, Y
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Carriers capturing of V-defect and its effect on leakage current and electroluminescence in InGaN-based light-emitting diodes 期刊论文
Applied Physics Letters, 2012, 卷号: 101, 期号: 25, 页码: 252110
Authors:  Le, L.C;  Zhao, D.G;  Jiang, D.S;  Zhang, S.M;  Yang, H;  Li, L;  Wu, L.L;  Chen, P;  Liu, Z.S;  Li, Z.C;  Fan, Y.M;  Zhu, J.J;  Wang, H
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Carriers capturing of V-defect and its effect on leakage current and electroluminescence in InGaN-based light-emitting diodes 期刊论文
Applied Physics Letters, 2012, 卷号: 101, 期号: 25, 页码: 252110
Authors:  Le, L.C;  Zhao, D.G;  Jiang, D.S;  Zhang, S.M;  Yang, H;  Li, L;  Wu, L.L;  Chen, P;  Liu, Z.S;  Li, Z.C;  Fan, Y.M;  Zhu, J.J;  Wang, H
Adobe PDF(1056Kb)  |  Favorite  |  View/Download:633/147  |  Submit date:2013/04/19