Knowledge Management System Of Institute of Semiconductors,CAS
New way to enhance the uniformity of self-organized InAs quantum dots | |
Zhu HJ; Wang H; Wang ZM; Cui LQ; Feng SL; Zhu HJ Chinese Acad Sci Inst Semicond Natl Lab Superlattices & Microstruct Beijing 100083 Peoples R China. | |
1999 | |
会议名称 | 25th International Symposium on Compound Semiconductors |
会议录名称 | COMPOUND SEMICONDUCTORS 1998, (162) |
页码 | 433-437 |
会议日期 | OCT 12-16, 1998 |
会议地点 | NARA, JAPAN |
出版地 | DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND |
出版者 | IOP PUBLISHING LTD |
ISSN | 0951-3248 |
ISBN | 0-7503-0611-4 |
部门归属 | chinese acad sci, inst semicond, natl lab superlattices & microstruct, beijing 100083, peoples r china |
摘要 | Growth interruption was introduced after the deposition of GaAs cap layer, which is thinner than the mean height of Quantum dots. Uniformity of quantum dots has been enhanced because the full width of half maximum of photoluminescence decrease from 80meV to 27meV in these samples as the interruption time increasing from 0 to 120 second. Meanwhile, we have observed that the peak position of photoluminescence is a function of interruption time. This effect can be used to control the energy level of quantum dots. The phenomena mentioned above can be attributed to the diffusion of In atoms from the top of InAs islands to the top of GaAs cap layer caused by the difference of surface energies between InAs and GaAs. |
关键词 | Molecular-beam Epitaxy Threshold Growth Laser |
学科领域 | 半导体物理 |
主办者 | Inst Electr, Informat & Commun Engineers Japan.; IEEE Electron Devices Soc.; IEEE Lasers & Electro Opt Soc.; Japan Soc Appl Phys. |
收录类别 | CPCI-S |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/14887 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Zhu HJ Chinese Acad Sci Inst Semicond Natl Lab Superlattices & Microstruct Beijing 100083 Peoples R China. |
推荐引用方式 GB/T 7714 | Zhu HJ,Wang H,Wang ZM,et al. New way to enhance the uniformity of self-organized InAs quantum dots[C]. DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND:IOP PUBLISHING LTD,1999:433-437. |
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