Knowledge Management System Of Institute of Semiconductors,CAS
Pressure behavior of Te isoelectronic centers in S-rich ZnS1-xTex alloy | |
Li GH; Fang ZL; Su FH; Ma BS; Ding K; Han HX; Sou IK; Ge WK; Li GH Chinese Acad Sci Inst Semicond Natl Lab Superlattices & Microstruct POB 912 Beijing 100083 Peoples R China. | |
2003 | |
会议名称 | 10th International Conference on High Pressures in Semiconductor Physics (HPSP-X) |
会议录名称 | PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 235 (2) |
页码 | 401-406 |
会议日期 | AUG 05-08, 2002 |
会议地点 | GUILDFORD, ENGLAND |
出版地 | PO BOX 10 11 61, D-69451 WEINHEIM, GERMANY |
出版者 | WILEY-V C H VERLAG GMBH |
ISSN | 0370-1972 |
部门归属 | chinese acad sci, inst semicond, natl lab superlattices & microstruct, beijing 100083, peoples r china; hong kong univ sci & technol, dept phys, kowloon, hong kong, peoples r china |
摘要 | The photoluminescence from ZnS1-xTex alloy with 0 < x < 0.3 was investigated under hydrostatic pressure up to 7 GPa. Two peaks were observed in the alloys with x < 0.01, which are related to excitons bound to isolated Te isoelectronic impurities (Te-1 centers) and Te pairs (Te-2 centers), respectively. Only the Te-2 related emissions were observed in the alloys with 0.01 < x < 0.03. The emissions in the alloys with 0.03 < x < 0.3 are attributed to the excitons bound to the Te-n (n greater than or equal to 3) cluster centers. The pressure coefficient of the Te-1 related peak is 89(4) meV/GPa, about 40% larger than that of the band gap of ZnS. On the other hand, the pressure coefficient of the Te-2 related emissions is only 52(4) meV/GPa, about 15% smaller than that of the ZnS band gap. A simple Koster-Slater model has been used to explain the different pressure behavior of the Te-1 and Te-2 centers. The pressure coefficient of the Te-3 centers is 62(2) meV/GPa. Then the pressure coefficients of the Te-n centers decrease rapidly with further increasing Te composition. |
关键词 | Optical-absorption Zns-te Transition Edge |
学科领域 | 半导体物理 |
主办者 | 会议主办方: UNIV SURREY |
收录类别 | CPCI-S |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/14861 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Li GH Chinese Acad Sci Inst Semicond Natl Lab Superlattices & Microstruct POB 912 Beijing 100083 Peoples R China. |
推荐引用方式 GB/T 7714 | Li GH,Fang ZL,Su FH,et al. Pressure behavior of Te isoelectronic centers in S-rich ZnS1-xTex alloy[C]. PO BOX 10 11 61, D-69451 WEINHEIM, GERMANY:WILEY-V C H VERLAG GMBH,2003:401-406. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
2825.pdf(179KB) | 限制开放 | -- | 请求全文 |
个性服务 |
推荐该条目 |
保存到收藏夹 |
查看访问统计 |
导出为Endnote文件 |
谷歌学术 |
谷歌学术中相似的文章 |
[Li GH]的文章 |
[Fang ZL]的文章 |
[Su FH]的文章 |
百度学术 |
百度学术中相似的文章 |
[Li GH]的文章 |
[Fang ZL]的文章 |
[Su FH]的文章 |
必应学术 |
必应学术中相似的文章 |
[Li GH]的文章 |
[Fang ZL]的文章 |
[Su FH]的文章 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论