Hydrogen related defects in InP
Han YJ; Liu XL; Jiao JH; Lin LY; Han YJ Chinese Acad Sci Inst Semicond Lab Semicond Mat Sci POB 912 Beijing 100083 Peoples R China.
1998
会议名称Symposium on Light Emitting Devices for Optoelectronic Applications / 28th State-of-the-Art Program on Compound Semiconductors at 193th Electrochemical-Soc Meeting
会议录名称PROCEEDINGS OF THE SYMPOSIUM ON LIGHT EMITTING DEVICES FOR OPTOELECTRONIC APPLICATIONS AND THE TWENTY-EIGHTH STATE-OF-THE-ART PROGRAM ON COMPOUND SEMICONDUCTORS, 98 (2)
页码351-358
会议日期MAY 03-08, 1998
会议地点SAN DIEGO, CA
出版地65 S MAIN ST, PENNINGTON, NJ 08534-2839 USA
出版者ELECTROCHEMICAL SOCIETY INC
ISBN1-56677-194-3
部门归属chinese acad sci, inst semicond, lab semicond mat sci, beijing 100083, peoples r china
摘要Local vibrational modes(LVMs) in tenths of InP samples reveal clearly existence of complexes related to hydrogen. Complexes of vacancy at indium site with one to four hydrogen atom(s) and isolated hydrogen or hydrogen dimers and complexes of hydrogen with various impurities and intrinsic defects are investigated by FTIR. Especially hydrogen related complexes between various transition metals and hydrogen or hydrogen related complexes between hydrogen with point defects. New LVMs related to hydrogen will be reported in this paper. Dynamical formation mechanism of defects in the annealed nominally undoped semiinsulating InP obtained by high pressure, high temperature annealing of ultra purity materials is proposed. Hydrogen can acts as actuator for antistructure defects production. Structural, electronic and vibrational properties of LVMs related to hydrogen as well as their temperature effects are discussed.
学科领域半导体材料
主办者Electrochem Soc, Electr Div.
收录类别CPCI-S
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/13879
专题中国科学院半导体研究所(2009年前)
通讯作者Han YJ Chinese Acad Sci Inst Semicond Lab Semicond Mat Sci POB 912 Beijing 100083 Peoples R China.
推荐引用方式
GB/T 7714
Han YJ,Liu XL,Jiao JH,et al. Hydrogen related defects in InP[C]. 65 S MAIN ST, PENNINGTON, NJ 08534-2839 USA:ELECTROCHEMICAL SOCIETY INC,1998:351-358.
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