SEMI OpenIR

浏览/检索结果: 共3条,第1-3条 帮助

已选(0)清除 条数/页:   排序方式:
无权访问的条目 期刊论文
作者:  Yongzheng Hu, Lijun Wang , Fengqi Liu,Jinchuan Zhang, Junqi Liu,and Zhanguo Wang
Adobe PDF(397Kb)  |  收藏  |  浏览/下载:522/204  |  提交时间:2014/02/12
Micro-raman investigation of defects in a 4H-SiC homoepilayer 会议论文
Silicon Carbide and Related Materials 2006丛书标题: MATERIALS SCIENCE FORUM, Newcastle upon Tyne, ENGLAND, SEP, 2006
作者:  Liu, XF (Liu, X. F.);  Sun, GS (Sun, G. S.);  Li, JM (Li, J. M.);  Zhao, YM (Zhao, Y. M.);  Li, JY (Li, J. Y.);  Wang, L (Wang, L.);  Zhao, WS (Zhao, W. S.);  Luo, MC (Luo, M. C.);  Zeng, YP (Zeng, Y. P.);  Liu, XF, Chinese Acad Sci, Inst Semicond, Novel Semicond Mat Lab, Beijing 100083, Peoples R China.
Adobe PDF(1318Kb)  |  收藏  |  浏览/下载:1515/197  |  提交时间:2010/03/29
Micro-raman  4h-sic  Defects  3c-inclusions  Triangle-shaped Inclusion  Epitaxial Layers  Silicon-carbide  
无权访问的条目 期刊论文
作者:  Zhao L (Zhao Lei);  Zuo YH (Zuo Yuhua);  Cheng BW (Cheng Buwen);  Yu JZ (Yu Jinzhong);  Wang QM (Wang Qiming);  Zhao, L, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China. E-mail: leizhao@semi.ac.cn
Adobe PDF(342Kb)  |  收藏  |  浏览/下载:1331/286  |  提交时间:2010/04/11