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无权访问的条目 期刊论文
作者:  Zhao YW;  Dong ZY;  Duan ML;  Sun WR;  Yang ZX;  Zhao, YW, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China. E-mail: zhaoyw@red.semi.ac.cn
Adobe PDF(116Kb)  |  收藏  |  浏览/下载：1141/255  |  提交时间：2010/04/11
Growth of high quality semi-insulating InP single crystal by suppression of compensation defects 会议论文
JOURNAL OF RARE EARTHS, Beijing, PEOPLES R CHINA, OCT 16-19, 2005
作者:  Zhao, YW;  Dong, ZY;  Duan, ML;  Sun, WR;  Yang, ZX;  Zhao, YW, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China. 电子邮箱地址: zhaoyw@red.semi.ac.cn
Adobe PDF(222Kb)  |  收藏  |  浏览/下载：1405/300  |  提交时间：2010/03/29
Indium Phosphide  
Annealing ambient controlled deep defect formation in InP 会议论文
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 27 (1-3), Batz sur Mer, FRANCE, SEP 29-OCT 02, 2003
作者:  Zhao YW;  Dong ZY;  Duan ML;  Sun WR;  Zeng YP;  Sun NF;  Sun TN;  Zhao YW Chinese Acad Sci Inst Semicond Ctr Mat Sci POB 912 Beijing 100083 Peoples R China. 电子邮箱地址: zhaoyw@red.semi.ac.nc
Adobe PDF(186Kb)  |  收藏  |  浏览/下载：1617/301  |  提交时间：2010/10/29
Fe-doped Inp  Semiinsulating Inp  Point-defects  Pressure  Wafers  Traps  
无权访问的条目 期刊论文
作者:  Zhao, YW;  Dong, ZY;  Duan, ML;  Sun, WR;  Zeng, YP;  Sun, NF;  Sun, TN;  Zhao, YW, Chinese Acad Sci, Inst Semicond, Ctr Mat Sci, POB 912, Beijing 100083, Peoples R China. 电子邮箱地址: zhaoyw@red.semi.ac.nc
Adobe PDF(155Kb)  |  收藏  |  浏览/下载：835/216  |  提交时间：2010/03/09
无权访问的条目 期刊论文
作者:  Dong ZY;  Zhao YW;  Zeng YP;  Duan ML;  Sun WR;  Jiao JH;  Lin LY;  Dong ZY,Chinese Acad Sci,Inst Semicond,Ctr Mat Sci,POB 912,Beijing 100083,Peoples R China.
Adobe PDF(387Kb)  |  收藏  |  浏览/下载：1512/402  |  提交时间：2010/08/12
Single steady frequency and narrow line width external cavity semiconductor laser 会议论文
ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES, 5188, SAN DIEGO, CA, AUG 03-05, 2003
作者:  Zhao WR;  Jiang PF;  Xie FZ;  Zhao WR Chinese Acad Sci Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(275Kb)  |  收藏  |  浏览/下载：1392/257  |  提交时间：2010/10/29
External Cavity Semiconductor Laser  Light Feedback  Single Longitudinal Mode  Spectral Line Width  Feedback  Diode  
Real-time far distance micro-vibration measurement using an external cavity semiconductor laser interferometer with a feedback control system 会议论文
OPTICAL DESIGN AND TESTING, 4927, SHANGHAI, PEOPLES R CHINA, OCT 15-18, 2002
作者:  Zhao WR;  Jiang PF;  Xie FZ;  Zhao WR Chinese Acad Sci Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(137Kb)  |  收藏  |  浏览/下载：1283/269  |  提交时间：2010/10/29
External Cavity Semiconductor Laser Interferometer  Far Distance  Micro-vibration Measurement  Feedback Control  Displacement Measurement  Diode Interferometer  Phase