中文版 | English

在结果中检索

SEMI OpenIR

浏览/检索结果: 共1条，第1-1条 帮助

已选(0)清除 条数/页：   排序方式：
Frequency limitation in calibrating microwave test fixtures 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Qian C;  Wang YL;  Chen ZY;  Zhu NH;  Qian C CAS State Key Lab Integrated Optoelect Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(217Kb)  |  收藏  |  浏览/下载：1344/222  |  提交时间：2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration