Frequency limitation in calibrating microwave test fixtures

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	Frequency limitation in calibrating microwave test fixtures
	Qian C; Wang YL; Chen ZY; Zhu NH; Qian C CAS State Key Lab Integrated Optoelect Inst Semicond Beijing 100083 Peoples R China.
	2002
会议名称	3rd International Conference on Microwave and Millimeter Wave Technology
会议录名称	2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS
页码	146-149
会议日期	AUG 17-19, 2002
会议地点	BEIJING, PEOPLES R CHINA
出版地	345 E 47TH ST, NEW YORK, NY 10017 USA
出版者	IEEE
ISBN	0-7803-7486-X
部门归属	cas, state key lab integrated optoelect, inst semicond, beijing 100083, peoples r china
摘要	The problem of frequency limitation arising in calibration of the test fixtures is investigated in this paper. It is found that at some frequencies periodically, the accuracy of the methods becomes very low, and. the denominators of the expressions of the required S-parameters approach zero. This conclusion can be drawn whether-the test fixtures, are symmetric or not. A good agreement between theory and experiment is obtained.
关键词	Calibration Microwave Network Analyzer Scattering-parameter Measurement Phase Uncertainty Network-analyzer Calibration
学科领域	光电子学
主办者	Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/13609
专题	中国科学院半导体研究所（2009年前）
通讯作者	Qian C CAS State Key Lab Integrated Optoelect Inst Semicond Beijing 100083 Peoples R China.
推荐引用方式 GB/T 7714	Qian C,Wang YL,Chen ZY,et al. Frequency limitation in calibrating microwave test fixtures[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2002:146-149.

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