AN EFFICIENT ITERATIVE DFT-BASED CHANNEL ESTIMATION FOR MIMO-OFDM SYSTEMS ON MULTIPATH CHANNELS

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	AN EFFICIENT ITERATIVE DFT-BASED CHANNEL ESTIMATION FOR MIMO-OFDM SYSTEMS ON MULTIPATH CHANNELS
	Jian, HF; Shi, Y; Jian, HF, Chinese Acad Sci, Inst Semicond, Grad Univ, Beijing 100083, Peoples R China.
	2008
会议名称	3rd International Conference on Communications and Networking in China
会议录名称	2008 THIRD INTERNATIONAL CONFERENCE ON COMMUNICATIONS AND NETWORKING IN CHINA
页码	VOLS 1-3: 42-46
会议日期	AUG 25-27, 2008
会议地点	Hangzhou, PEOPLES R CHINA
出版地	345 E 47TH ST, NEW YORK, NY 10017 USA
出版者	IEEE
ISBN	978-1-4244-2373-6
部门归属	[jian haifang] chinese acad sci, inst semicond, grad univ, beijing 100083, peoples r china
摘要	In this paper, an efficient iterative discrete Fourier transform (DFT) -based channel estimator with good performance for multiple-input and multiple-output orthogonal frequency division multiplexing (MIMO-OFDM) systems such as IEEE 802.11n which retain some sub-carriers as null sub-carriers (or virtual carriers) is proposed. In order to eliminate the mean-square error (MSE) floor effect existed in conventional DFT-based channel estimators, we proposed a low-complexity method to detect the significant channel impulse response (CIR) taps, which neither need any statistical channel information nor a predetermined threshold value. Analysis and simulation results show that the proposed method has much better performance than conventional DFT-based channel estimators and without MSE floor effect.
关键词	Channel Estimation Mimo-ofdm Dft-based Ieee P802.11n D2.0
学科领域	微电子学
主办者	IEEE.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/8338
专题	中国科学院半导体研究所（2009年前）
通讯作者	Jian, HF, Chinese Acad Sci, Inst Semicond, Grad Univ, Beijing 100083, Peoples R China.
推荐引用方式 GB/T 7714	Jian, HF,Shi, Y,Jian, HF, Chinese Acad Sci, Inst Semicond, Grad Univ, Beijing 100083, Peoples R China.. AN EFFICIENT ITERATIVE DFT-BASED CHANNEL ESTIMATION FOR MIMO-OFDM SYSTEMS ON MULTIPATH CHANNELS[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2008:VOLS 1-3: 42-46.

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