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SEMI OpenIR  > 中国科学院半导体研究所（2009年前）
一种对气体传感器或半导体器件性能进行测试的系统
王晓亮; 王新华; 冯春; 王保柱; 马志勇; 王军喜; 胡国新; 肖红领; 冉军学; 王翠梅
2008-03-12
Date Available2009-06-04 ; 2009-06-11
Subtype发明
Application Date2006-09-06
Language中文
Application Number200610112883
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/3975
Collection中国科学院半导体研究所（2009年前）
Recommended Citation
GB/T 7714		 王晓亮,王新华,冯春,等. 一种对气体传感器或半导体器件性能进行测试的系统[P]. 2008-03-12.
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200610112883.pdf（973KB） 限制开放--Application Full Text
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