SEMI OpenIR  > 中科院半导体材料科学重点实验室
一种InxAl1-xN/AlN复合势垒层氮化镓基异质结高电子迁移率晶体管结构
王晓亮; 李巍; 肖红领; 冯春; 姜丽娟; 殷海波; 王翠梅; 李百泉
Rights Holder中国科学院半导体所
Date Available2016-09-28
Country中国
Subtype发明
Subject Area半导体材料
Application Date2015-01-06
Application NumberCN201520005583.7
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27623
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
王晓亮,李巍,肖红领,等. 一种InxAl1-xN/AlN复合势垒层氮化镓基异质结高电子迁移率晶体管结构.
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一种In-sub-x--sub-Al-s(414KB) 限制开放LicenseApplication Full Text
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