SEMI OpenIR  > 高速电路与神经网络实验室
基于SURF算法的遥控器面板印刷缺陷自动检测方法
王俭; 来疆亮; 鲁华祥; 边昳; 陈旭; 李威
Rights Holder中国科学院半导体所
Date Available2016-09-28
Country中国
Subtype发明
Subject Area人工智能
Application Date2015-01-26
Application NumberCN201510037520.4
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27599
Collection高速电路与神经网络实验室
Recommended Citation
GB/T 7714
王俭,来疆亮,鲁华祥,等. 基于SURF算法的遥控器面板印刷缺陷自动检测方法.
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