Knowledge Management System Of Institute of Semiconductors,CAS
基于SURF算法的遥控器面板印刷缺陷自动检测方法 | |
王俭; 来疆亮; 鲁华祥; 边昳; 陈旭; 李威 | |
Rights Holder | 中国科学院半导体所 |
Date Available | 2016-09-28 |
Country | 中国 |
Subtype | 发明 |
Subject Area | 人工智能 |
Application Date | 2015-01-26 |
Application Number | CN201510037520.4 |
Document Type | 专利 |
Identifier | http://ir.semi.ac.cn/handle/172111/27599 |
Collection | 高速电路与神经网络实验室 |
Recommended Citation GB/T 7714 | 王俭,来疆亮,鲁华祥,等. 基于SURF算法的遥控器面板印刷缺陷自动检测方法. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
基于SURF算法的遥控器面板印刷缺陷自动(1648KB) | 限制开放 | License | Application Full Text |
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