基于SURF算法的遥控器面板印刷缺陷自动检测方法

SEMI OpenIR > 高速电路与神经网络实验室

	基于SURF算法的遥控器面板印刷缺陷自动检测方法
	王俭; 来疆亮; 鲁华祥; 边昳; 陈旭; 李威
Rights Holder	中国科学院半导体所
Date Available	2016-09-28
Country	中国
Subtype	发明
Subject Area	人工智能
Application Date	2015-01-26
Application Number	CN201510037520.4
Document Type	专利
Identifier	http://ir.semi.ac.cn/handle/172111/27599
Collection	高速电路与神经网络实验室
Recommended Citation GB/T 7714	王俭,来疆亮,鲁华祥,等. 基于SURF算法的遥控器面板印刷缺陷自动检测方法.

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