| 测量选通像增强器光学门宽的装置及方法 | |
| 王新伟; 周燕; 李友福 | |
| Rights Holder | 中国科学院半导体所 |
| Date Available | 2016-09-12 |
| Country | 中国 |
| Subtype | 发明 |
| Subject Area | 光电子学 |
| Application Date | 2014-11-10 |
| Application Number | CN201410643209.X |
| Document Type | 专利 |
| Identifier | http://ir.semi.ac.cn/handle/172111/27468 |
| Collection | 光电系统实验室 |
| Recommended Citation GB/T 7714 | 王新伟,周燕,李友福. 测量选通像增强器光学门宽的装置及方法. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 测量选通像增强器光学门宽的装置及方法.p（1034KB） | 限制开放 | License | Application Full Text | |||
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