基于视觉芯片的编带内芯片外观缺陷检测系统

	基于视觉芯片的编带内芯片外观缺陷检测系统
	李搏
Subtype	硕士
Thesis Advisor	吴南健
	2015-05
Degree Grantor	中国科学院研究生院
Place of Conferral	北京
Degree Discipline	集成电路工程
Date Available	2015-06-02
Document Type	学位论文
Identifier	http://ir.semi.ac.cn/handle/172111/26550
Collection	半导体超晶格国家重点实验室
Recommended Citation GB/T 7714	李搏. 基于视觉芯片的编带内芯片外观缺陷检测系统[D]. 北京. 中国科学院研究生院,2015.

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