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一种水平全限制相变量子点相变机理的检测方法
付英春; 王晓峰; 季安; 杨富华
Rights Holder中国科学院半导体研究所
Date Available2013-05-15
Country中国
Subtype发明
Subject Area微电子学
Application Date2013-01-31
Application NumberCN201310038944.3
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25889
Collection半导体集成技术工程研究中心
Recommended Citation
GB/T 7714
付英春,王晓峰,季安,等. 一种水平全限制相变量子点相变机理的检测方法.
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