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纳米刻蚀印章及利用其进行纳米刻蚀的方法
裴为华; 陈三元; 归强; 陈弘达
Rights Holder中国科学院半导体研究所
Date Available2013-06-12
Country中国
Subtype发明
Subject Area光电子学
Application Date2013-02-28
Application NumberCN201310062552.0
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25870
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
裴为华,陈三元,归强,等. 纳米刻蚀印章及利用其进行纳米刻蚀的方法.
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