一种利用关键点特征匹配的图像跟踪方法

SEMI OpenIR > 高速电路与神经网络实验室

	一种利用关键点特征匹配的图像跟踪方法
	蒋寓文; 王守觉; 李卫军; 谭乐怡
Rights Holder	中国科学院半导体研究所
Date Available	2014-07-30
Country	中国
Subtype	发明
Subject Area	人工智能
Application Date	2014-04-21
Application Number	CN201410160273.2
Document Type	专利
Identifier	http://ir.semi.ac.cn/handle/172111/25705
Collection	高速电路与神经网络实验室
Recommended Citation GB/T 7714	蒋寓文,王守觉,李卫军,等. 一种利用关键点特征匹配的图像跟踪方法.

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