| PZT调制系数测试装置及测试方法 | |
| 方高升; 徐团伟; 李芳 | |
| Rights Holder | 中国科学院半导体研究所 |
| Date Available | 2013-10-09 |
| Country | 中国 |
| Subtype | 发明 |
| Subject Area | 光电子学 |
| Application Date | 2013-06-26 |
| Application Number | CN201310257844.X |
| Document Type | 专利 |
| Identifier | http://ir.semi.ac.cn/handle/172111/25565 |
| Collection | 光电系统实验室 |
| Recommended Citation GB/T 7714 | 方高升,徐团伟,李芳. PZT调制系数测试装置及测试方法. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| PZT调制系数测试装置及测试方法.pdf（399KB） | 限制开放 | License | Application Full Text | |||
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