PZT调制系数测试装置及测试方法 | |
方高升; 徐团伟; 李芳 | |
Rights Holder | 中国科学院半导体研究所 |
Date Available | 2013-10-09 |
Country | 中国 |
Subtype | 发明 |
Subject Area | 光电子学 |
Application Date | 2013-06-26 |
Application Number | CN201310257844.X |
Document Type | 专利 |
Identifier | http://ir.semi.ac.cn/handle/172111/25565 |
Collection | 光电系统实验室 |
Recommended Citation GB/T 7714 | 方高升,徐团伟,李芳. PZT调制系数测试装置及测试方法. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
PZT调制系数测试装置及测试方法.pdf(399KB) | 限制开放 | License | Application Full Text |
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