电力绝缘设备性能测量及电流传感器固有相移测量方法

SEMI OpenIR > 高速电路与神经网络实验室

	电力绝缘设备性能测量及电流传感器固有相移测量方法
	张放; 鲁华祥; 龚国良; 陈刚; 金敏; 边昳
Rights Holder	中国科学院半导体研究所
Date Available	2013-08-14
Country	中国
Subtype	发明
Subject Area	人工智能
Application Date	2013-05-16
Application Number	CN201310181107.6
Document Type	专利
Identifier	http://ir.semi.ac.cn/handle/172111/25530
Collection	高速电路与神经网络实验室
Recommended Citation GB/T 7714	张放,鲁华祥,龚国良,等. 电力绝缘设备性能测量及电流传感器固有相移测量方法.

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