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一种对光波导通光性能进行测试的方法
杨惠霞; 谢亮; 王瑞
Rights Holder中国科学院半导体研究所
Date Available2014-01-22
Country中国
Subtype发明
Subject Area光电子学
Application Date2013-10-22
Application NumberCN201310498613.8
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25507
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
杨惠霞,谢亮,王瑞. 一种对光波导通光性能进行测试的方法.
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