SEMI OpenIR  > 半导体集成技术工程研究中心
一种无结晶体管的电阻测试方法
王昊; 韩伟华; 马刘红; 杨富华
Rights Holder中国科学院半导体研究所
Date Available2014-02-12
Country中国
Subtype发明
Subject Area微电子学
Application Date2013-10-25
Application NumberCN201310511410.8
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25495
Collection半导体集成技术工程研究中心
Recommended Citation
GB/T 7714
王昊,韩伟华,马刘红,等. 一种无结晶体管的电阻测试方法.
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