Knowledge Management System Of Institute of Semiconductors,CAS
基于差影法的遥控器按键缺陷检测方法 | |
张敏; 鲁华祥; 来疆亮; 边昳; 龚国良; 徐露露 | |
Rights Holder | 中国科学院半导体研究所 |
Date Available | 2013-12-11 |
Country | 中国 |
Subtype | 发明 |
Subject Area | 人工智能 |
Application Date | 2013-08-16 |
Application Number | CN201310357352.8 |
Document Type | 专利 |
Identifier | http://ir.semi.ac.cn/handle/172111/25433 |
Collection | 高速电路与神经网络实验室 |
Recommended Citation GB/T 7714 | 张敏,鲁华祥,来疆亮,等. 基于差影法的遥控器按键缺陷检测方法. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
基于差影法的遥控器按键缺陷检测方法.pd(1911KB) | 限制开放 | License | Application Full Text |
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