Knowledge Management System Of Institute of Semiconductors,CAS
| 基于差影法的遥控器按键缺陷检测方法 | |
| 张敏; 鲁华祥; 来疆亮; 边昳; 龚国良; 徐露露 | |
| Rights Holder | 中国科学院半导体研究所 |
| Date Available | 2013-12-11 |
| Country | 中国 |
| Subtype | 发明 |
| Subject Area | 人工智能 |
| Application Date | 2013-08-16 |
| Application Number | CN201310357352.8 |
| Document Type | 专利 |
| Identifier | http://ir.semi.ac.cn/handle/172111/25433 |
| Collection | 高速电路与神经网络实验室 |
| Recommended Citation GB/T 7714 | 张敏,鲁华祥,来疆亮,等. 基于差影法的遥控器按键缺陷检测方法. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 基于差影法的遥控器按键缺陷检测方法.pd（1911KB） | 限制开放 | License | Application Full Text | |||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment