SEMI OpenIR  > 中科院半导体材料科学重点实验室
同步实现阻止GaAs盖层氧化和提高氧化层热稳定性的方法
周文飞; 徐波; 叶小玲; 张世著; 王占国
Rights Holder中国科学院半导体研究所
Date Available2012-07-25
Country中国
Subtype发明
Subject Area半导体材料
Application Date2012-03-27
Application NumberCN201210083214.0
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25366
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
周文飞,徐波,叶小玲,等. 同步实现阻止GaAs盖层氧化和提高氧化层热稳定性的方法.
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