Knowledge Management System Of Institute of Semiconductors,CAS
| 基于数学形态学的量子点检测方法 | |
| 徐露露; 鲁华祥; 边昳; 陈旭; 龚国良; 刘文鹏; 张放; 金敏; 陈刚 | |
| Rights Holder | 中国科学院半导体研究所 |
| Date Available | 2012-12-19 |
| Country | 中国 |
| Subtype | 发明 |
| Subject Area | 人工智能 |
| Application Date | 2012-07-05 |
| Application Number | CN201210232222.7 |
| Document Type | 专利 |
| Identifier | http://ir.semi.ac.cn/handle/172111/25232 |
| Collection | 高速电路与神经网络实验室 |
| Recommended Citation GB/T 7714 | 徐露露,鲁华祥,边昳,等. 基于数学形态学的量子点检测方法. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 基于数学形态学的量子点检测方法.pdf（1577KB） | 限制开放 | License | Application Full Text | |||
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