Knowledge Management System Of Institute of Semiconductors,CAS
低维拓扑绝缘体电子结构性质 | |
娄文凯 | |
Subtype | 博士 |
Thesis Advisor | 常凯 |
2012 | |
Degree Grantor | 中国科学院研究生院 |
Place of Conferral | 北京 |
Degree Discipline | 凝聚态物理 |
Subject Area | 半导体物理 |
Date Available | 2012-06-27 |
Document Type | 学位论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/23230 |
Collection | 半导体超晶格国家重点实验室 |
Recommended Citation GB/T 7714 | 娄文凯. 低维拓扑绝缘体电子结构性质[D]. 北京. 中国科学院研究生院,2012. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
娄文凯.pdf(11092KB) | 限制开放 | License | Application Full Text |
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