Study on surface morphology of GaN growth by MOCVD on GaN/Si(111) template
Liu, Z; Wang, JX; Wang, XL; Hu, GX; Guo, LC; Liu, HX; Li, JP; Li, JM; Zeng, YP; Wang, JX, Chinese Acad Sci, Inst Semicond, Novel Mat Lab, Beijing 100083, Peoples R China. 电子邮箱地址: jxwang@red.semi.ac.cn
2006
会议名称3rd Asian Conference on Crystal Growth and Crystal Technology (CGCT-3)
会议录名称JOURNAL OF RARE EARTHS
页码24: 11-13 Sp. Iss. SI
会议日期OCT 16-19, 2005
会议地点Beijing, PEOPLES R CHINA
出版地2 XINJIEKOUWAI DAJIE, BEIJING 100088, PEOPLES R CHINA
出版者METALLURGICAL INDUSTRY PRESS
ISSN1002-0721
部门归属chinese acad sci, inst semicond, novel mat lab, beijing 100083, peoples r china
摘要The surface morphology of GaN grown by MOCVD on GaN/Si template was studied. Rough morphology and deep pinhole defects on some surface areas of the samples were observed and studied. The formation of rough morphology is possibly related to Ga-Si alloy produced due to poor thermal stability of template at high temperature. The deep pinhole defects generated are deep down to the surface of MBE-grown GaN/Si template. The stress originated from the large thermal expansion coefficient difference between GaN and Si may be related to the formation of the pinhole defects. The surface morphology of the GaN can be improved by optimizing the GaN/Si template and decreasing the growth temperature.
关键词Surface Morphology
学科领域半导体材料
主办者Chinese Assoc Crystal Growth.; Crystal Mat Shandong Univ, State Key Lab.; CAS, Tech Inst Phys & Chem.; Res Inst Synthet Crystal.; Japanese Soc Promot Sci, 161 Comm.
收录类别其他
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/10028
专题中国科学院半导体研究所(2009年前)
通讯作者Wang, JX, Chinese Acad Sci, Inst Semicond, Novel Mat Lab, Beijing 100083, Peoples R China. 电子邮箱地址: jxwang@red.semi.ac.cn
推荐引用方式
GB/T 7714
Liu, Z,Wang, JX,Wang, XL,et al. Study on surface morphology of GaN growth by MOCVD on GaN/Si(111) template[C]. 2 XINJIEKOUWAI DAJIE, BEIJING 100088, PEOPLES R CHINA:METALLURGICAL INDUSTRY PRESS,2006:24: 11-13 Sp. Iss. SI.
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