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Optical rectification and Pockels effect as a method to detect the properties of Si surfaces 期刊论文
CHINESE OPTICS LETTERS, 2017, 卷号: 15, 期号: 6, 页码: 062401
Authors:  Qi Wang;  Li Zhang;  Xin Wang;  Haiyan Quan;  Zhanguo Chen;  Jihong Zhao;  Xiuhuan Liu;  Lixin Hou;  YanjunGao;  Gang Jia;  Shaowu Chen
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