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Two-port calibration of test fixtures with OSL method. 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Chen ZY;  Wang YL;  Liu Y;  Zhu NH;  Chen ZY CAS Inst Semicond State Key Lab Integrated Optoelect Beijing 100083 Peoples R China.
Adobe PDF(212Kb)  |  收藏  |  浏览/下载：1660/408  |  提交时间：2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration  Line  
Choice of calibration equations of the TSM method 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Wang YL;  Chen ZY;  Zhu NH;  Wang YL CAS Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(205Kb)  |  收藏  |  浏览/下载：1258/276  |  提交时间：2010/10/29
Calibration  Network Analyzer  Frequency Limitation  Scattering-parameter Measurement  Network-analyzer Calibration  Test Fixtures  
Frequency limitation in calibrating microwave test fixtures 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Qian C;  Wang YL;  Chen ZY;  Zhu NH;  Qian C CAS State Key Lab Integrated Optoelect Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(217Kb)  |  收藏  |  浏览/下载：1302/222  |  提交时间：2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration  
Formation and magnetic properties of Fe16N2 films prepared by ion-beam-assisted deposition 会议论文
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 177, CAIRNS, AUSTRALIA, JUL 27-AUG 01, 1997
作者:  Yao ZY;  Jiang H;  Liu ZK;  Huang DD;  Qin FG;  Zhu SC;  Sun YX;  Zhu SC Peking Univ Dept Phys Beijing 100871 Peoples R China.
Adobe PDF(166Kb)  |  收藏  |  浏览/下载：1470/281  |  提交时间：2010/11/15
Thin Films  Saturation Magnetization  Uniaxial Anisotropy