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Two-port calibration of test fixtures with OSL method. 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Chen ZY;  Wang YL;  Liu Y;  Zhu NH;  Chen ZY CAS Inst Semicond State Key Lab Integrated Optoelect Beijing 100083 Peoples R China.
Adobe PDF(212Kb)  |  收藏  |  浏览/下载：1574/408  |  提交时间：2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration  Line  
Choice of calibration equations of the TSM method 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Wang YL;  Chen ZY;  Zhu NH;  Wang YL CAS Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(205Kb)  |  收藏  |  浏览/下载：1117/276  |  提交时间：2010/10/29
Calibration  Network Analyzer  Frequency Limitation  Scattering-parameter Measurement  Network-analyzer Calibration  Test Fixtures  
Frequency limitation in calibrating microwave test fixtures 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Qian C;  Wang YL;  Chen ZY;  Zhu NH;  Qian C CAS State Key Lab Integrated Optoelect Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(217Kb)  |  收藏  |  浏览/下载：1221/222  |  提交时间：2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration  
Strong red light emission from silicon nanocrystals embedded in SIO2 matrix 会议论文
COMMAD 2002 PROCEEDINGS, SYDNEY, AUSTRALIA, DEC 11-13, 2002
作者:  Chen WD;  Wang YQ;  Chen CY;  Diao HW;  Liao XB;  Kong GL;  Hsu CC;  Chen WD Chinese Acad Sci Inst Semicond POB 912 Beijing 100083 Peoples R China.
Adobe PDF(265Kb)  |  收藏  |  浏览/下载：1305/291  |  提交时间：2010/10/29
Photoluminescence  Luminescence  Spectroscopy  Deposition  
16-channel VCSEL based multiple chip modules 会议论文
2002 DIGEST OF THE LEOS SUMMER TOPICAL MEETINGS, MT TREMBLANT, CANADA, JUL 15-17, 2002
作者:  Chen HD;  Mao LH;  Tiang J;  Liang K;  Shen RX;  Du Y;  Huang YZ;  Wu RH;  Feng J;  Ke XM;  Liu HY;  Wang ZG;  Chen HD Chinese Acad Sci Inst Semicond State Key Lab Integrated Optoelect Beijing 100083 Peoples R China.
Adobe PDF(146Kb)  |  收藏  |  浏览/下载：2058/366  |  提交时间：2010/10/29
Detection of indium segregation effects in InGaAs/GaAs quantum wells using reflectance-difference spectrometry 会议论文
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 91, RIMINI, ITALY, SEP 24-28, 2001
作者:  Ye XL;  Chen YH;  Xu B;  Wang ZG;  Chen YH Chinese Acad Sci Inst Semicond Lab Semicond Mat Sci POB 912 Beijing 100083 Peoples R China.
Adobe PDF(125Kb)  |  收藏  |  浏览/下载：1110/220  |  提交时间：2010/11/15
Reflectance-difference Spectroscopy  Indium Segregation  Ingaas/gaas Quantum Wells  Epitaxy-grown Ingaas/gaas  Surface Segregation  Interface