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Diffractive Grating Based Out-of-Plane Coupling between Silicon Nanowire and Optical Fiber 会议论文
, Shanghai, PEOPLES R CHINA, AUG 30-SEP 03, 2009
作者:  Li ZY;  Zhu Y;  Zhou L;  Li YT;  Han WH;  Fan ZC;  Yu YD;  Yu JZ;  Li, ZY, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Adobe PDF(227Kb)  |  收藏  |  浏览/下载：2025/455  |  提交时间：2010/06/04
Development of current-based microscopic defect analysis method using optical filling techniques for the defect study on heavily irradiated high-resistivity Si sensors/detectors 会议论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Beijing, PEOPLES R CHINA, SEP 13-19, 2005
作者:  Li, Z (Li, Z.);  Li, CJ (Li, C. J.);  Li, Z, Brookhaven Natl Lab, Upton, NY 11973 USA. 电子邮箱地址: zhengl@bnl.gov
Adobe PDF(175Kb)  |  收藏  |  浏览/下载：1318/373  |  提交时间：2010/03/29
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