SEMI OpenIR  > 中科院半导体材料科学重点实验室
发光二极管响应特性的测试系统及方法
牛立涛; 关敏; 楚新波; 李弋洋; 曾一平
Rights Holder中国科学院半导体所
Date Available2016-08-30
Country中国
Subtype发明
Subject Area半导体材料
Application Date2014-09-02
Application NumberCN201410443019.3
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27315
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
牛立涛,关敏,楚新波,等. 发光二极管响应特性的测试系统及方法.
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发光二极管响应特性的测试系统及方法.pd(640KB) 限制开放LicenseApplication Full Text
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