SEMI OpenIR  > 半导体超晶格国家重点实验室
一种像素间串扰检测系统及方法
秦琦; 吴南健
Rights Holder中国科学院半导体所
Date Available2016-08-30
Country中国
Subtype发明
Subject Area半导体物理
Application Date2014-12-25
Application NumberCN201410822961.0
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27243
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
秦琦,吴南健. 一种像素间串扰检测系统及方法.
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