SEMI OpenIR  > 光电子研究发展中心
基于交错时序检测相消机制的阵列式电容传感器接口电路
张旭; 胡晓晖; 刘鸣; 陈弘达
Rights Holder中国科学院半导体研究所
Date Available2014-06-25
Country中国
Subtype发明
Subject Area光电子学
Application Date2014-04-03
Application NumberCN201410132968.X
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25729
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
张旭,胡晓晖,刘鸣,等. 基于交错时序检测相消机制的阵列式电容传感器接口电路.
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