SEMI OpenIR  > 全固态光源实验室
一种简易式可调节X型光路平行调试检测装置
林学春; 杨盈莹; 赵伟芳; 王文婷; 伊肖静; 张玲; 于海娟
Rights Holder中国科学院半导体研究所
Date Available2013-09-18
Country中国
Subtype发明
Subject Area半导体器件
Application Date2013-06-05
Application NumberCN201310220604.2
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25581
Collection全固态光源实验室
Recommended Citation
GB/T 7714
林学春,杨盈莹,赵伟芳,等. 一种简易式可调节X型光路平行调试检测装置.
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