SEMI OpenIR  > 半导体超晶格国家重点实验室
一种检测光通讯波段半导体材料发光单光子特性的方法
周鹏宇; 孙宝权; 窦秀明; 武雪飞; 丁琨
Rights Holder中国科学院半导体研究所
Date Available2014-02-12
Country中国
Subtype发明
Subject Area半导体物理
Application Date2013-11-21
Application NumberCN201310594591.5
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25451
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
周鹏宇,孙宝权,窦秀明,等. 一种检测光通讯波段半导体材料发光单光子特性的方法.
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