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基于频数直方图测量脉冲激光全脉宽的方法; 基于频数直方图测量脉冲激光全脉宽的方法
王新伟; 张欣; 周燕; 刘育梁
Rights Holder中国科学院半导体研究所
Date Available2011-08-31 ; 2011-08-31 ; 2011-08-31
Country中国
Subtype发明
Abstract本发明公开了一种基于频数直方图测量脉冲激光全脉宽的方法,该方法通过对采集到的激光时域脉形数据进行频数直方图分析,得到基于频数直方图的分布特征,然后基于该分布特征选取n阶幅值作为阈值,并由该阈值在激光时域脉形中确定一平行于X轴的阈值线,该阈值线与脉形曲线相交,存在多个交点,选取位于脉形峰值点两侧且最近邻峰值点的两交点为测量点,此两测量点间对应的时间宽度便是激光的n阶脉宽。本发明适应性好,测量有效性高,与传统的n%脉宽相比可更为准确地测量激光脉宽。
metadata_83光电系统实验室
Patent NumberCN201010564589.X
Language中文
Status公开
Application NumberCN201010564589.X
Patent Agent周国城
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/22485
Collection光电系统实验室
Recommended Citation
GB/T 7714
王新伟,张欣,周燕,等. 基于频数直方图测量脉冲激光全脉宽的方法, 基于频数直方图测量脉冲激光全脉宽的方法. CN201010564589.X.
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