Choice of calibration equations of the TSM method

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	Choice of calibration equations of the TSM method
	Wang YL; Chen ZY; Zhu NH; Wang YL CAS Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
	2002
会议名称	3rd International Conference on Microwave and Millimeter Wave Technology
会议录名称	2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS
页码	150-153
会议日期	AUG 17-19, 2002
会议地点	BEIJING, PEOPLES R CHINA
出版地	345 E 47TH ST, NEW YORK, NY 10017 USA
出版者	IEEE
ISBN	0-7803-7486-X
部门归属	cas, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
摘要	For the reciprocal-test fixtures, there are six independent S-parameters to. be determined, and the thru-short-match (TSM) calibration can provide eight calibration equations. In this paper, the relation of calibration equations is investigated. It has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. Experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantages of the established relation among the calibration equations and properly choosing calibration equations.
关键词	Calibration Network Analyzer Frequency Limitation Scattering-parameter Measurement Network-analyzer Calibration Test Fixtures
学科领域	光电子学
主办者	Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/13611
专题	中国科学院半导体研究所（2009年前）
通讯作者	Wang YL CAS Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
推荐引用方式 GB/T 7714	Wang YL,Chen ZY,Zhu NH,et al. Choice of calibration equations of the TSM method[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2002:150-153.

条目包含的文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
2795.pdf（205KB）			限制开放	--	请求全文