Two-port calibration of test fixtures with OSL method.

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	Two-port calibration of test fixtures with OSL method.
	Chen ZY; Wang YL; Liu Y; Zhu NH; Chen ZY CAS Inst Semicond State Key Lab Integrated Optoelect Beijing 100083 Peoples R China.
	2002
会议名称	3rd International Conference on Microwave and Millimeter Wave Technology
会议录名称	2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS
页码	138-141
会议日期	AUG 17-19, 2002
会议地点	BEIJING, PEOPLES R CHINA
出版地	345 E 47TH ST, NEW YORK, NY 10017 USA
出版者	IEEE
ISBN	0-7803-7486-X
部门归属	cas, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
摘要	The open-short-load (OSL) method is very simple and widely used, for one-port test fixture calibration. In this paper, this method. is extended to the two-port calibration of test fixtures for the first time. The problem of phase uncertainty arising in this application has been solved. The comparison between our results and those obtained with the short-open-load-thru (SOLT) method shows that the method established is accurate enough for practical applications.
关键词	Calibration Microwave Network Analyzer Scattering-parameter Measurement Phase Uncertainty Network-analyzer Calibration Line
学科领域	光电子学
主办者	Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/13607
专题	中国科学院半导体研究所（2009年前）
通讯作者	Chen ZY CAS Inst Semicond State Key Lab Integrated Optoelect Beijing 100083 Peoples R China.
推荐引用方式 GB/T 7714	Chen ZY,Wang YL,Liu Y,et al. Two-port calibration of test fixtures with OSL method.[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2002:138-141.

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