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Small-signal and large-signal performance test of high-speed optoelectronics devices | |
Zhu NH; Chen C; Sun JW; Pun EYB; Chung PS; Zhu, NH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. | |
2005 | |
会议名称 | Conference on Semiconductor and Organic Optoelectronic Materials and Devices |
会议录名称 | SEMICONDUCTOR AND ORGANIC OPTOELECTRONIC MATERIALS AND DEVICES丛书标题: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) |
页码 | 5624: 308-319 |
会议日期 | NOV 09-11, 2004 |
会议地点 | Beijing, PEOPLES R CHINA |
出版地 | 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA |
出版者 | SPIE-INT SOC OPTICAL ENGINEERING |
ISSN | 0277-786X |
ISBN | 0-8194-5578-4 |
部门归属 | chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
摘要 | This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given. |
关键词 | Scattering Parameters |
学科领域 | 光电子学 |
主办者 | SPIE.; Chinese Opt Soc.; China Inst Commun.; Beijing Assoc Commun & Informat.; Beijing Univ Posts & Telecommun.; IEEE COMSOC.; IEEE LEOS.; Commun Inst China, Opt Commun Tech Comm.; Opt Soc Amer.; Tsinghua Univ. |
收录类别 | 其他 |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/10128 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Zhu, NH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. |
推荐引用方式 GB/T 7714 | Zhu NH,Chen C,Sun JW,et al. Small-signal and large-signal performance test of high-speed optoelectronics devices[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2005:5624: 308-319. |
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