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Circuit design and simulation of a CMOS-based preamplifier for brain neural signals | |
Sui XH; Pei WH; Gu M; Liu JB; Chen HD; Sui, XH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China. | |
2005 | |
会议名称 | 1st International Conference on Neural Interface and Control (CNIC) |
会议录名称 | 2005 First International Conference on Neural Interface and Control Proceedings |
页码 | 108-110 |
会议日期 | MAY 26-28, 2005 |
会议地点 | Wuhan, PEOPLES R CHINA |
出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA |
出版者 | IEEE |
ISBN | 0-7803-8902-6 |
部门归属 | chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
摘要 | A novel CMOS-based preamplifier for amplifying brain neural signal obtained by scalp electrodes in brain-computer interface (BCI) is presented in this paper. By means of constructing effective equivalent input circuit structure of the preamplifier, two capacitors of 5 pF are included to realize the DC suppression compared to conventional preamplifiers. Then this preamplifier is designed and simulated using the standard 0.6 mu m MOS process technology model parameters with a supply voltage of 5 volts. With differential input structures adopted, simulation results of the preamplifier show that the input impedance amounts to more than 2 Gohm with brain neural signal frequency of 0.5 Hz-100 Hz. The equivalent input noise voltage is 18 nV/Hz(1/2). The common mode rejection ratio (CMRR) of 112 dB and the open-loop differential gain of 90 dB are achieved. |
关键词 | Bci |
学科领域 | 光电子学 |
主办者 | Huazhong Univ Sci & Technol.; Arizona State Univ.; Tsinghua Univ. |
收录类别 | 其他 |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/10124 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Sui, XH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China. |
推荐引用方式 GB/T 7714 | Sui XH,Pei WH,Gu M,et al. Circuit design and simulation of a CMOS-based preamplifier for brain neural signals[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2005:108-110. |
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