Knowledge Management System Of Institute of Semiconductors,CAS
| Impact of diode facet reflectivity on the fiber grating external cavity semiconductor laser | |
| Xu QY; Chen SW; Xu, QY, Chinese Acad Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China. | |
| 2004 | |
| Conference Name | 5th International Conference on Thin Film Physics and Applications |
| Source Publication | FIFTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS丛书标题: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) |
| Pages | 5774: 519-522 |
| Conference Date | MAY 31-JUN 02, 2004 |
| Conference Place | Shanghai, PEOPLES R CHINA |
| Publication Place | 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA |
| Publisher | SPIE-INT SOC OPTICAL ENGINEERING |
| ISSN | 0277-786X |
| ISBN | 0-8194-5755-8 |
| metadata_83 | chinese acad sci, inst semicond, beijing 100083, peoples r china |
| Abstract | The scattering matrix method is used to analyze the multiple reflection effect between the laser diode facet and the fiber grating facet by considering the fiber grating external cavity laser diode (FGECL) as a four-mirror cavity laser. When neglecting other important parameters such as butt-coupling distance between the diode and the fiber facets, coupling efficiency, external cavity length, it is shown that low reflectivity is not a crucial factor for the laser characteristics such as SMSR. Experimentally high SMSR fiber grating external cavity laser is fabricated with a relatively large residual facet reflectivity (about 1%), which is coincident with our simulation results. |
| Keyword | Fiber Grating |
| Subject Area | 光电子学 |
| Funding Organization | Chinese Phys Soc.; Shanghai Phys Soc.; Natl Nat Sci Fdn China.; E China Normal Univ, Sch Informat Sci & Technol.; Fudan Univ, Appl Surface Phys Lab.; Natl Lab Infrared Phys.; CAS, Shanghai Inst Tech Phys.; E China Normal Univ, Key Lab Opt & Magnet Resonance Spectroscopy. |
| Indexed By | 其他 |
| Language | 英语 |
| Document Type | 会议论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/10070 |
| Collection | 中国科学院半导体研究所（2009年前） |
| Corresponding Author | Xu, QY, Chinese Acad Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China. |
| Recommended Citation GB/T 7714 | Xu QY,Chen SW,Xu, QY, Chinese Acad Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China.. Impact of diode facet reflectivity on the fiber grating external cavity semiconductor laser[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2004:5774: 519-522. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 2418.pdf（267KB） | 限制开放 | -- | Application Full Text | |||
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