中文版 | English

在结果中检索

SEMI OpenIR

浏览/检索结果: 共3条，第1-3条 帮助

限定条件    
已选(0)清除 条数/页：   排序方式：
A High-Speed CMOS Image Sensor with Column-Parallel Single Capacitor CDSs and Single-slope ADCs 会议论文
Proceedings of SPIE 卷: 8194 文献号: 819433, Beijing, PEOPLES R CHINA, 2011
作者:  Li QL (Li Quanliang);  Shi C (Shi Cong);  Wu NJ (Wu Nanjian)
Adobe PDF(482Kb)  |  收藏  |  浏览/下载：8534/3325  |  提交时间：2011/12/13
Temporal Differential CMOS Image Sensor for Low-Light and High-Speed Applications 会议论文
International Symposium on Photoelectronic Detection and Imaging 2011 - Advances in Imaging Detectors and Applications, Beijing, PEOPLES R CHINA, 2011
作者:  Guan N (Guan Ning);  Zhang X (Zhang Xu);  Dong Z (Dong Zan);  Wang W (Wang Wei);  Gui Y (Gui Yun);  Han JQ (Han Jianqiang);  Wang Y (Wang Yuan);  Huang BJ (Huang Beiju);  Chen HD (Chen Hongda)
Adobe PDF(516Kb)  |  收藏  |  浏览/下载：1953/510  |  提交时间：2011/12/13
Development of current-based microscopic defect analysis method using optical filling techniques for the defect study on heavily irradiated high-resistivity Si sensors/detectors 会议论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Beijing, PEOPLES R CHINA, SEP 13-19, 2005
作者:  Li, Z (Li, Z.);  Li, CJ (Li, C. J.);  Li, Z, Brookhaven Natl Lab, Upton, NY 11973 USA. 电子邮箱地址: zhengl@bnl.gov
Adobe PDF(175Kb)  |  收藏  |  浏览/下载：1311/373  |  提交时间：2010/03/29
Dlts