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Choice of calibration equations of the TSM method 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Wang YL;  Chen ZY;  Zhu NH;  Wang YL CAS Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
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Calibration  Network Analyzer  Frequency Limitation  Scattering-parameter Measurement  Network-analyzer Calibration  Test Fixtures