中文版 | English
SEMI OpenIR

分面浏览：出处

当前检索式 ((ALL：Scanning Electron Microscope))
限定条件 ((语种：英语))
共174条，第1-20条
JOURNAL OF CRYSTAL G 24 APPLIED PHYSICS LETT 9 JOURNAL OF APPLIED P 7
OPTICS EXPRESS 7 RSC Advances 7 CHINESE PHYSICS LETT 6
APPLIED SURFACE SCIE 5 Applied Physics Lett 5 IEEE PHOTONICS TECHN 5
Journal of Semicondu 5 Nanoscale 5 Optics Express 5
PHYSICAL REVIEW B 5 ADVANCED FUNCTIONAL 4 CHINESE PHYSICS B 4
IEEE Photonics Journ 4 IEEE Photonics Techn 4 OPTICS LETTERS 4
半导体学报 4 ACS NANO 3