Object-recognition with oblique observation directions based on biomimetic pattern recognition
Wang SJ; Chen X; Li WJ; Wang, SJ, Chinese Acad Sci, Inst Semicond, Artificial Neural Networks Lab, POB 912, Beijing 100083, Peoples R China.
2005
会议名称International Conference on Neural Networks and Brain (ICNN&B 2005)
会议录名称Proceedings of the 2005 International Conference on Neural Networks and Brain
页码Vols 1-3: 1498-1502
会议日期OCT 13-15, 2005
会议地点Beijing, PEOPLES R CHINA
出版地345 E 47TH ST, NEW YORK, NY 10017 USA
出版者IEEE
ISBN0-7803-9422-4
部门归属chinese acad sci, inst semicond, artificial neural networks lab, beijing 100083, peoples r china
摘要In this paper, we propose a new scheme for omnidirectional object-recognition in free space. The proposed scheme divides above problem into several onmidirectional object-recognition with different depression angles. An onmidirectional object-recognition system with oblique observation directions based on a new recognition theory-Biomimetic Pattern Recognition (BPR) is discussed in detail. Based on it, we can get the size of training samples in the onmidirectional object-recognition system in free space. Omnidirection ally cognitive tests were done on various kinds of animal models of rather similar shapes. For the total 8400 tests, the correct recognition rate is 99.89%. The rejection rate is 0.11% and on the condition of zero error rates. Experimental results are presented to show that the proposed approach outperforms three types of SVMs with either a three degree polynomial kernel or a radial basis function kernel.
学科领域人工智能
主办者China Neural Networks Council.; IEEE Computat Intelligence Soc, Beijing Chapter.; Chinese Inst Elect.; Chinese Assoc Artificial Intelligence.
收录类别其他
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/9868
专题中国科学院半导体研究所(2009年前)
通讯作者Wang, SJ, Chinese Acad Sci, Inst Semicond, Artificial Neural Networks Lab, POB 912, Beijing 100083, Peoples R China.
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GB/T 7714
Wang SJ,Chen X,Li WJ,et al. Object-recognition with oblique observation directions based on biomimetic pattern recognition[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2005:Vols 1-3: 1498-1502.
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